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SEM medium magnification resolution standards, tin on carbon disc Mount:Mount L 2mm diameter pin stub sample

SEM medium magnification resolution standards, tin on carbon disc Mount:Mount L 2mm diameter pin stub sample

Name: SEM medium magnification resolution standards, tin on carbon disc Mount:Mount L 2mm diameter pin stub sample
Brand: businesscommunicationnetwork.com
SKU: 72437486231
Price: 285.50 USD
Availability: InStock
Rating: 4.3042 (15 reviews)

SKU: 72437486231

4.3

USD285.50 USD323.50

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SEM medium magnification resolution standards, tin on carbon disc Mount:Mount L 2mm diameter pin stub sampleDispersion of tin spheres, the majority being within the size range of 10nm to 100nm, on a carbon substrate that is 6mm x 0. 5mm. Ideal for astigmatism correction and resolution determination. Recommended for SEM, FESEM, and FIB in the semiconductor industry where gold on carbon cannot be tolerated. This standard is available unmounted or mounted on a specimen stub of your choice. SEM mount selections Type A R: Technical Data

Store: businesscommunicationnetwork.com · Domain: businesscommunicationnetwork.com

Description

2mm diameter pin stub sample and comes in a PELCO storage box

two gauges and 3/8" hose nipples

The Correlative Microscopy Coverslips are available in three patterns for different application requirements

No tunnel vision

Microtome Blade Guide

Exchange/Return Notes